What is the best test method—logic built-in self test (BIST) or automatic test pattern generation (ATPG)?

Posted: February 26, 2013 in Test Equipment
Tags: , , , , , , , , , , , , , , , , ,

In this article from Test & Measurement world, Ron Press mentions the values of each technology and shows the advantage of using a hybrid ATPG/BIST method.

Read the whole article here! 

Optimizing autonomous IC test without sacrificing precision

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